The JCM-7000 Benchtop Scanning Electron Microscope is designed based on a key concept of “Easy-to-use SEM with seamless navigation and live analysis”. The JCM-7000 incorporates three innovative functions; “Zeromag” for smooth transition from optical to SEM imaging, “Live Analysis” for finding constituent elements for an image observation area, and “Live 3D” for displaying a reconstructed live 3D image during SEM observation. When you place the JCM-7000 next to an optical microscope, further-faster and more-detailed foreign material analysis and quality control can be made.
Magnification: x10 to 100,000 (magnification is defined by 128 mm x 96 mm)
Imaging mode: High-Vacuum mode: Secondary electron image, Backscattered electron image (composition, topographic or shadow image), 3D. Low-Vacuum mode: Backscattered electron image (composition, topographic or shadow image), 3D
Accelerating Voltage: 5kV, 10kV, 15kV (s stages)
Electron gun: Tungsten cathode with integrated filamenet-Wehnelt cartridge
Motor stage: X-Y 2 axis; standard
Maximum sample size: 80mm diameter x 50 mm height