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MarSurf XR1 – Surface Roughness Measurement

Mahr_MarSurf_PC_base
Overview
The ideal instrument for a low-cost introduction to user-friendly surface metrology. The PC-based instrument delivers all common surface parameters and profiles in accordance with international standards, both in the measuring room and in production. MarSurf XR 1 from Mahr stands for innovative roughness evaluation software.
 
Key Features:
– Over 80 surface parameters for R-, P- and W-profiles according to current ISO/JIS or MOTIF standards (ISO 12085)
– Bandpass filter Ls in accordance with current standard; Ls can also be switched off or varied as required
– Comprehensive measuring records
– Teach-in methods for the rapid creation of Quick&Easy measuring programs
– Automatic functions for choosing cut-off and traversing length in accordance with standards
– Support for various calibration methods (static and dynamic) by specifying the Ra or Rz parameter
 
Technical Data
 
Measuring principle: Stylus method
Probe: BFW skidless system with MarSurf SD 26 drive unit and/or PHT skidded system with MarSurf RD 18 drive unit
Measuring range mm: +/- 250 µm (up to +/- 750 µm with 3x probe arm length) applies to BFW system, 350 µm applies to PHT probe system
Filter according to ISO/JIS: filter as per ISO 16610-21(replaced Gaussian filter as per ISO 11562), robust Gaussian filter a per ISO 16610-31
Traversing lengths: MarSurf GD 26 / SD 26: Automatic; 0.56 mm*; 1.75 mm; 5.6 mm; 17.5 mm, 56 mm,
Measurement up to stop, variable *Traversing length dependent on drive unit, RD 18: Automatic; 1.75 mm; 5.6 mm; 17.5 mm
Number n of sampling length according to ISO/JIS: 1 to 50 (default: 5)
Stylus: 2 µm
Measuring force (N): 0.75 mN
Surface parameters: Over 80 surface parameters for R, P and W profiles according to current ISO/JIS or MOTIF standards (ISO 12085)

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