Overview
The CIQTEK SEM3300 Scanning Electron Microscope (SEM) incorporates technologies such as “Super-Tunnel” electron optics, inlens electron detectors, and electrostatic & electromagnetic compound objective lens. By applying these technologies to the tungsten filament microscope, the long-standing resolution limit of such SEM is surpassed, enabling the tungsten filament SEM to perform low-voltage analysis tasks previously only achievable with field emission SEMs.
 
Application:
– Nano Science
– Semiconductor
– Automobile
– Chemistry
– Electronics
– Pharmaceutical

Benefits & features
– Break Through the Resolution Limit of Tungsten Filament SEMs
– In-lens Electron Detector
– Electromagnetic & Electrostatic Combo Objective Lens
– Safer to Use
– Excellent Expandability

In-lens Electron Detector

For carbon material samples, under low excitation voltages, the beam penetration depth is shallow, enabling the capturing of the true surface morphology information with richer details of the specimen.

For polymer fiber samples, high excitation voltages cause beam damage to the specimen, while low voltage beam enables the preservation of surface details without damage.

Low Vacuum SEM Mode
The CIQTEK SEM3200 SEM Microscope supports 2-stage low vacuum modes: 5~180 Pa chamber pressure can be reached without pressure limiting aperture, and 180~1000 Pa is achievable with PLA. The specially designed objective lens vacuum chamber minimizes electron mean free path in low-vacuum, and maintains the resolution at 3 nm @ 30 kV.

Optical Navigation
Using a vertically mounted chamber camera to capture optical images for specimen stage navigation allows for a more intuitive and accurate specimen positioning.

Intelligent Assisted Image Astigmatism Correction
Under this mode, the astigmatism value of X and Y varies with the pixels. The image clarity is maximized at the optimal astigmatism value, enabling rapid stigmator adjustment.

Auto Functions
Improved Automatic Brightness & Contrast, Automatic Focus, and Automatic Astigmatism Correction Functions. Imaging by a single click!

Automatic Focus

Automatic Astigmatism Correction

Automatic Brightness & Contrast

Specifications