Overview
The CIQTEK SEM4000X is a stable, versatile, flexible, and efficient field emission scanning electron microscope (FE-SEM). It achieves a resolution of 1.9nm@1.0kV, and easily tackles high-resolution imaging challenges for various types of samples. It can be upgraded with an ultra-beam deceleration mode to enhance low-voltage resolution even further. The microscope utilizes multi-detector technology, with an in-column electron detector (UD) capable of detecting SE and BSE signals while providing high-resolution performance. The chamber-mounted electron detector (LD) incorporates crystal scintillator and photomultiplier tubes, offering higher sensitivity and efficiency, resulting in stereoscopic images with excellent quality. The graphic user interface is user-friendly, featuring automation functions such as automatic brightness & contrast, auto-focus, auto stigmator, and automatic alignment, allowing for rapid capture of ultra-high resolution images.
 
Application:
– Nano Science
– Semiconductor
– Automobile
– Chemistry
– Electronics
– Pharmaceutical

Benefits & features
– High Resolution
– Multi-detector Technology
– Simplified Alignment
– Built from a Higher-end Platform
– Ultra Beam Deceleration Mode Technology
– Excellent Expandability

Electron Optics

Auto Functions
Improved Automatic Brightness & Contrast, Automatic Focus, and Automatic Astigmatism Correction Functions. Imaging by a single click!

Automatic Focus

Automatic Astigmatism Correction

Automatic Brightness & Contrast

Specifications