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Nikon Eclipse LV-DAF

nikon-metrology-industrial-microscopes-upright-Eclipse-LV-DAF
Overview
The LV-DAF delivers fast, versatile autofocus with the Hybrid Auto-Focus system, making the most of two types of auto focus systems. Combining slit projection and contrast detection auto focus, it features large focus range and fast tracking ability. A variety of observation methods are supported, including brightfield, darkfield and differential interference contrast (DIC), as well as various transparent samples.
 
Key Features:
Hybrid Auto-Focus
Compatibility with LV Series Microscopes
Multiple Observation Methods
 
Specifications
 
Detection system:: Hybrid system combining slit projection with contrast detection
 
Auto-focus light source: Near-IR LED (λ = 770 nm)
 
Objective lens: CFI60 objective lens 2.5x-100x (includes extra-long working distance (ELWD), super-long working distance (SLWD), and CR for LCD substrate inspection)
 
Auto-focus modes: Continuous mode and search mode (single, continuous)
 
Focal range: Focal range without searching (brightfield). 2.5x: 5.5 mm or more, 5x: 4.5 mm or more, 10x: 1.3 mm or more, 20x: 320 μm or more, 50x: 50 μm or more, 100x: 10 μm or more
 
Focal time: 0.7 seconds or less (20x: 200μm with no search)
 
Focal precision (repeated reproducibility): 1/2 or less of focal depth
 
AF offset feature: Enables observation with precise adjustment of focal position while applying auto-focus
 
Minimum driveresolution: 0.05 μm
 
External communication: RS232C, USB, and parallel I/O
 
Power source: 100-240 V AC, 1.0 A, 50/60 Hz
 

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