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Nikon Eclipse LV150N

LV150N_Image
Overview
A manual, nosepiece type microscope which meets the various needs of observation, inspection, research and analysis across a wide range of industrial fields. Higher NA and a longer working distance than ever before means superior optical performance and efficient digital imaging.
Max. sample size: 150 x 150 mm.
 
Applications:
Liquid Crystal Displays (lcd), Antennae, Surface Examination, Telecom & Electronics, MEMS, Metallurgy, Implants/ Protheses, Composites,Fabrics/Textiles, Optoelectronics, Metal Manufacturing, Microelectronics, Wafers, Telescope optics, Mobile phones, shavers & watches
 
Benefits & features
 
 
Modularized microscope body applicable with various observations and tasks
Compatible with brightfield, darkfield, simple polarizing, DIC, epifluorescence and two-beam interferometry observations. It supports diverse and advanced research, analysis and inspection.
Compatible observation methods:
nikon-metrology-industrial-microscopes-upright-compatible-observation-methods-LV150N-LV150NA
Compatible stages
– LV-S32 3×2 stage (Stroke: 75 x 50 mm with glass plate) *Can be fitted with LV-S32SPL ESD plate
– LV-S6 6×6 stage (Stroke: 150 x 150 mm) *Can be fitted with LV-S6WH wafer holder / LV-S6PL ESD plate
– LV-SRP P revolving stage
– P-GS2 G stage 2 (Used with stage adapter LV-SAD)
Newly developed CFI60-2 series
Newly developed CFI60-2 series provides the ultimate in long working distance levels and the most advanced chromatic aberration in a light weight body
CFI60-2 series offers higher NA and longer working distances than ever before.
Nikon_LV150N_nikon-metrology-industrial-microscopes-upright-Eclipse-objectives-for-brightfield-observation
 
Easy digital imaging
Information about the objective in use is detected and displayed on the camera control unit. In addition, the information is automatically converted into appropriate calibration data when changing magnification.
– Digital Camera System for Microscopy Digital Sight Serie
– Imaging Software NIS-Elements
Nikon_LV150N_metrology-industrial-microscopes-upright-digital-imaging
 
Specifications
 
Base unit:
Maximum sample height: 38 mm (when used with LVNU5AI U5AI nosepiece and LV-S32 3×2 stage / LV-S64 6×4 stage) * 73 mm when used with one column riser 12V50W internal power source for dimmer, coarse and fine adjustment knobs Left: coarse and fine adjustment / Right: fine adjustment, 40 mm stroke Coarse adjustment: 14 mm/turn (with torque adjustment, refocusing mechanism)
Fine adjustment: 0.1 mm/turn (1 μm/graduation) Stage mounting hole intervals: 70 x 94 (fixed by 4-M4 screw)
 
Nosepieces:
C-N6 ESD Sextuple Nosepiece ESD LV-NU5 Universal Quintuple Nosepiece ESD LV-NBD5 BD Quintuple Nosepiece ESD LV-NU5I Intelligent Universal Quintuple Nosepiece ESD
Episcopic Illuminator:
LV-UEPI-N
LV-LH50PC 12V50W Precentered Lamphouse Bright/darkfield switch and linked aperture stop (centerable), field diaphragm (centerable) Accepts ø 25 mm filter (NCB11, ND16, ND4), polarizer/analyzer, plate, excitation light balancer; equipped with noise terminator
LV-UEPI2
LV-LH50PC 12V50W Precentered Lamphouse HG precentered fiber illuminator: C-HGFIE (with light adjustment) *option Bright/darkfield switch and linked aperture stop (centerable), field diaphragm (centerable), automated optical element switching feature matched to brightfield, darkfield, and epi-fluorescence switch Accepts ø 25 mm filter (NCB11, ND16, ND4), polarizer/analyzer, λ plate, excitation light balancer; equipped with noise terminator
 
Eyepiece Tube:
LV-TI3 trinocular eyepiece tube ESD (Erected image, FOV: 22/25)
LV-TT2 TT2 tilting trinocular eyepiece tube (Erected image, FOV: 22/25)
C-TB binocular tube (Inverted image, FOV: 22)
P-TB Binocular Tube (Inverted image, FOV: 22)
P-TT2 Trinocular Tube (Inverted image, FOV: 22)
 
Stage:
LV-S32 3×2 stage (Stroke: 75 x 50 mm with glass plate) ESD compatible
LV-S64 6×4 stage (Stroke: 150 x 100 mm with glass plate) ESD compatible
LV-S6 6×6 stage (Stroke: 150 x 150 mm) ESD compatible
 
Eyepieces:
CFI eyepiece lens series
 
Objectives:
Industrial Microscope CFI60-2/CFI60 optical system Objective lens series: Combinations in accordance with the observation method
 
Weight: Approximately 8.6kg

OUR PHILOSOPHY

Always go the extra mile for you” –  this is our way of life. We don’t just say it. We live by it and show you by our action! Although we may not solve all your problems all the time, we will always go the extra mile to help you!!

RIGHT SYSTEM FOR THE RIGHT APPLICATION

Before order is placed, the application of the customer is discussed in detail. Base on our vast experience in various industries, we will offer the best and most cost effective solution for that application of the customer.

ON TIME DELIVERY WITH BEST QUALITY ASSURED

Complex instruments delivery may some times be long. However, we strive to ensure that we deliver the systems on time every time and with the utmost quality of the product assured!

GREAT AFTER SALES AND SERVICE

From installation to user application training to after sales services and support. We strive to ensure that every part of this is done by the best qualified engineers in a timely and professional way.