Overview
Park FX40 transforms atomic force microscopy, placing user benefits at the forefront through groundbreaking autonomy and advanced technology. Integrated intelligence and robotics automate set up and scanning tasks, freeing researchers from manual operations. This includes managing probes, alignment, sample positioning, and imaging optimization, allowing users to focus on their specialized work. With improved electromechanics, noise reduction, and multi-sample imaging, the FX40 streamlines data collection, research workflows, and data publication, empowering accelerated scientific progress and discovery.
 
Key Features:
Protect Your Sample
Environmental Sensors
Safety Probe Pickup

Benefits & features

Auto Probe Indenfication
The Probe Recognition Camera identifies the QR code imprinted on the chip carrier of a newly loaded probe and extracts and displays all pertinent information on each of the probes available, including the type, model, application, and usage. This enables you to quickly select the best probe for each job.

Protect Your Sample
New tip crash prevention protects the tip and AFM scanner using a combination of software interlock and hardware switch. Through algorithmic programming, the Z stage can’t physically go down any further than the limit of tip collision with the sample surface, allowing you peace of mind for the safety of your sample and AFM.

Environmental Sensors
SmartScan displays and stores measurements from sensors, which measure essential environmental conditions such as temperature, humidity, leveling and vibration. This allows you to compare your scanned images with different environmental channels, providing further environmental indicators for system diagnosis.

Safety Probe Pickup
Built-in robotics and a machine-learning algorithm detect and warn you about incorrectly placed probes, since you can use either the automatic or manual tip loading feature. Access various error status report during probe loading to make sure you have the highest degree of accuracy.

Auto Probe Exchange
With Automated Probe Exchange, you can now replace old probes easily and safely in full automation. Harnessing the convenience of an 8-probe cassette, along with a magnetic controlled mechanism, the Park FX40 autonomously mounts the probes.

Decoupled XY and Z Scanners
The fundamental difference Park and its closest competitor is in the scanner architecture. Park’s unique flexure based independent XY scanner and Z scanner design allows unmatched data accuracy in nano resolution in the industry.

Industry Leading Low Noise Z Detector
Park AFMs are equipped with the most effective low noise Z detectors in the field, with a noise of 0.02 nm over large bandwidth. This produces highly accurate topography and no edge overshoot. Just one of many ways Park AFM saves you times and gives you better data.

True Non-Contact Mode
True Non-Contact Mode is a scan mode unique to Park AFM systems that produces high resolution and accurate data by preventing destructive tip-sample interaction during a scan.