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Home >> Scanning Electron Microscopes >> SNE-3000MS Benchtop SEM

SNE-3000MS Benchtop SEM

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Overview
The SNE-3000MS is an entry level benchtop scanning electron microscope (SEM). The most appropriate Table-top SEM for the surface inspection with 10,000x of magnification which is main inspection range by SEM. It has a resolution of 15nm & magnification of 60,000x.
 
Application:
– Nano Science
– Semiconductor
– Automobile
– Chemistry
– Electronics
– Pharmaceutical
 
Benefits & features
 
 
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Specifications
 
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